Issue of Journal № 2, 1 part [22], 2010
List of articles
Nanoelectronics microwave. Analysis, synthesis and design of devices
Measurement of parameters and characteristics of microwave devices and materials
127–136 |
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137–139 |
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Salnikov A. S., Dobush I. M., Koshevoy S. E., Sheerman F. I. |
140–144 |
145–148 |
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149–152 |
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153–156 |
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Microwave Office PDK development for designing MMICs based on domestic HEMT technology |
157–160 |
161–165 |
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Loschilov A. G., Semenov E. V., Malyutin N. D., Misyunas A. O., Ilin A. A. |
166–170 |
Nonlinearity modeling of the baseband signal transformation by semiconductor diode |
171–174 |
175–177 |
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Microwave probes for measuring the characteristics of planar elements of integrated circuits |
178–179 |
Microwave technology nanoelectronics
Electronics, measurement technology, radio engineering and communications
213–219 |
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220–224 |
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225–228 |
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Alekseev V. P., Karaban V. M., Ponomarev S. V., Suntsov S. B. |
229–231 |
Alekseev V. P., Karaban V. M., Ponomarev S. V., Suntsov S. B. |
232–235 |
An optimization algorithm of antennas heights in the star topology networks |
236–243 |
244–248 |
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249–254 |