Salnikov Andrey Sergeevich

Articles:

• Automation of on-wafer measurements of S-parameters and current-voltage curves with Indesys-MS software environment
• Development of a scalable small-signal 0.1 µm GaAs-pHEMT-model for amplifier applications
• Experimental investigation and modeling of MMIC passive components by taking technological spread of parameters into account
• Ka-band coplanar MMIC amplifiers based on 0.13 m GaAs mHEMT process
• Ka-band monolithic coplanar amplifier based on the domestic heterojunction GaAs foundry
• Microwave Office PDK development for designing MMICs based on domestic HEMT technology
• Microwave Pseudomorphic High Electron Mobility Transistor
• Physical simulation of GaN/AlGaN HEMT-heterostructures and power microwave transistors using Synopsys software
• Powerful AlGaN/GaN HEMT- transistors X- and Ku-band
• Review of test structures intended for measurement of electrophysical parameters of materials in MMIC technology
• Scalable model building of a monolithic thin-film resistor based on RF measurement and electromagnetic simulation
• Software for data storage and statistical analysis in MMIC measurement automation system INDESYS-MS
• Software for measurement automation, deembedding and small-signal FET model extraction