Abstract: Software modules for on-wafer measurement automation of multibias S-parameters, deembedding, and extraction of MESFET and HEMT small-signal models is developed. The modules are included into software system INDESYS-MS that is integrated with on-wafer measurement setup.
Keywords: automation, on-wafer measurement, deembedding, model extraction, mmic, mesfet, hemt
Authors and copyright holders:
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For citation:
Dobush I. M., Stepacheva A. V., Kokolov A. A., Salnikov A. S., Babak L. I. Software for measurement automation, deembedding and small-signal FET model extraction. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2011, no. 2(24), – p. 2. pp. 99–105.
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