Abstract: The paper describes the software development for automation of on-wafer microwave measurements based on Indesys-MS program environment. The measurement scripts for S-parameters and I-V curves of transistor are presented. Hard- and software parts of a specialized set-up for on-wafer microwave measurements are described.
Keywords: on-wafer microwave measurements, automation, s-parameters, current-voltage curves
For citation:
Salnikov A. S., Dobush I. M., Koshevoy S. E., Sheerman F. I. Automation of on-wafer measurements of S-parameters and current-voltage curves with Indesys-MS software environment. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2010, no. 2(22), – p. 1. pp. 140–144.
Authors and copyright holders:
—
Last issue
-2026-1_%D0%BA%D0%BE%D0%BF%D0%B8%D1%8F.jpg)
Editorial office address
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 701-582
Viktor N. Maslennikov
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 51-21-21 / 51-43-02
Subscription for updates
