Research of application possibilities for model of near-field microwave interference microscope to solve the problems in hygroscopy and defectoscopy

Abstract: The authors discuss the schematic of a near-field microwave interference microscope - a new type of instrument. This circuit design is implemented in the most simplified structure of the current layout. The testing to identify the scope of this microscope is provided. It was shown that the microscope should be used to solve a number of hygroscope and flaw detection problems, investigation of cultural heritage items, and also in medicine.

Keywords: near-field diagnostics, interferential spatial scale, interference energy flux, evanescent field, microwave microscope, hygroscopy, defectoscopy

For citation:
Zapasnoy A. S., Belichenko V. P., Mironchev A. S. Research of application possibilities for model of near-field microwave interference microscope to solve the problems in hygroscopy and defectoscopy. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2017, vol. 20, no. 4, pp. 17–19. DOI: 10.21293/1818-0442-2017-20-4-17-19