Product quality improvement by using the cause-and-effect diagram in complex with information system of semiconductor production control

Abstract: We propose a method of increasing the efficiency of production by improving the quality of the products, which is based on reducing the impact of human factors by implementing statistical quality tools. Ishikawa diagram is considered and the need for its use in complex with the information system of semiconductor production control

Keywords: production quality, control system, semiconductor manufacturing, ishikawa diagram

For citation:
Zykov D. D., Matveev V. V., Nechaev K. A., Karaban V. M. Product quality improvement by using the cause-and-effect diagram in complex with information system of semiconductor production control. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2013, no. 4(30), pp. 173–176.