Download article in PDF format
Authors: Nomokonova N. N., Pivovarov D. S., Almina N. A.
Annotation: An information and measuring system for testing the individual properties of microelectronic devices is suggested. The system is based on the marginal voltages technique.
Keywords: marginal voltages, lsi quality inspection, frequency response
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 51-21-21 / 51-43-02
Proceedings of TUSUR University
Editor’s Office: 40 Lenina Prospect, office 310/2, 634050, Tomsk, Russia Phone: + 7 (3822) 51-21-21 vnmas@tusur.ru
Any use of texts or graphics published on journal.tusur.ru must be accompanied by an active hyperlink to the TUSUR site.
Это произведение доступно по
лицензии Creative Commons «Attribution» («Атрибуция») 4.0 Всемирная
.
