Abstract: An information and measuring system for testing the individual properties of microelectronic devices is suggested. The system is based on the marginal voltages technique.
Keywords: marginal voltages, lsi quality inspection, frequency response
For citation:
Nomokonova N. N., Pivovarov D. S., Almina N. A. Decision-making for results of microelectronic devices inspection. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2010, no. 2(22), – p. 2. pp. 36–37.
Authors and copyright holders:
—
Last issue
-2026-1_%D0%BA%D0%BE%D0%BF%D0%B8%D1%8F.jpg)
Editorial office address
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 701-582
Viktor N. Maslennikov
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 51-21-21 / 51-43-02
Subscription for updates
