Photoelectric Characteristics of Gallium Oxide-Based Photodetectors over a Wide Temperature and Voltage Range
DOI: 10.21293/1818-0442-2025-28-4-162-168
DOI: 10.21293/1818-0442-2025-28-4-162-168
Abstract: Gallium oxide filmы were deposited on a sapphire substrates by radio-frequency magnetron sputtering. Post-deposition annealing at 900 °C in argon for 30 minutes yielded polycrystalline β-phase Ga2O3 films with high stoichiometric quality. The resulting films had a thickness of 390 nm and exhibited a transmittance exceeding 70% in the long-wavelength region λ ≥ 310 nm. The band gap of the film increased from 4,74 to 4,87 eV as the temperature decreased from 350 to 10 K. The photoconductivity of structures at temperatures below 150 K is governed by the space-charge-limited currents. The photodetectors demonstrated extremely low dark currents (≤ 20 pA) and a maximum photosensitivity of 1.42 A/W at 150 K and 1100 V, indicating an internal gain mechanism. Time-dependent photoresponse analysis revealed a decrease in rise time from 65 ms to 32 ms and in decay time from 34 to 7 ms as the temperature increased from 10 to 350 K.
Keywords: Ga2O3, photodetector, UV-radiation, photoconductivity, gain
Funding: The study was supported by the Tomsk State University Development Programme (Priority-2030), Project No. 2.5.4.25 ML.
For citation:
Almaev D. A., Tsymbalov A. V., Kopiev V. V. Photoelectric Characteristics of Gallium Oxide-Based Photodetectors over a Wide Temperature and Voltage Range. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2025, vol. 28, no. 4, pp. 162–168. DOI: 10.21293/1818-0442-2025-28-4-162-168
Authors and copyright holders:
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 701-582
Viktor N. Maslennikov
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 51-21-21 / 51-43-02