Abstract: Development of measure-computing complex with high measurement accuracy, management flexibility, wide functional possibilities and low power consumption is reported. Application it in an experimental researches of electrical properties of semi-conductor devices has confirmed its high operational parameters.
For citation:
Belyaev S. V., Davydov V. N., Masyukov A. Yu., Kohlov A. L. Automatical complex based at aduc812 microchip for measurements of semiconductors’ electrical parametres. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2005, no. 3(11), pp. 5–11.
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