Automatical complex based at aduc812 microchip for measurements of semiconductors’ electrical parametres

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Authors: Belyaev S. V., Davydov V. N., Masyukov A. Yu., Kohlov A. L.

Annotation: Development of measure-computing complex with high measurement accuracy, management flexibility, wide functional possibilities and low power consumption is reported. Application it in an experimental researches of electrical properties of semi-conductor devices has confirmed its high operational parameters.