Abstract: The paper describes a method for contactless temperature measurement of semiconductor light sources. We present a theoretical analysis of the method and the results of temperature measuring of semiconductor light sources in a plastic case.
Keywords: semiconductor light source, temperature, radiation spectrum, spectral width of radiation
For citation:
Goncharova Yu. S., Romanova M. A., Smirnov S. V. Spectral method for the contactless temperature measurement of crystals in semiconductor light sources. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2015, no. 2(36), pp. 38–40.
Authors and copyright holders:
—
Last issue
-2026-1_%D0%BA%D0%BE%D0%BF%D0%B8%D1%8F.jpg)
Editorial office address
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 701-582
Viktor N. Maslennikov
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 51-21-21 / 51-43-02
Subscription for updates
