Measurement of dielectric permittivity based on a microstrip line: comparison of two implementation methods
DOI: 10.21293/1818-0442-2025-28-1-39-45
Abstract: In this paper, an analysis of two following ways to implement the measurement of permittivity based on a microstrip line was carried out: 1) when the dielectric is located above the signal conductor (open microstrip line); 2) when the dielectric is located between the non-metallized base (substrate) and the grounded metallized surface (suspended microstrip line). Based on the modeling and the experimental research carried out, a comparison of both methods was performed with an assessment of their applicability for materials of different thicknesses and a range of dielectric permeabilities. For the considered range of materials with low losses and dielectric constant from 2 to 100, it was determined that the open microstrip line is applicable for measuring the dielectric constant of materials with a thickness of more than 5 mm, while the suspended microstrip line, due to geometric features, is more suitable for materials with a thickness of 1 mm or less.
Keywords: effective dielectric constant, microstrip transmission line, differential phase method, vector network analyzer
For citation:
Petenenko Ya. A., Trenkal E. I. Measurement of dielectric permittivity based on a microstrip line: comparison of two implementation methods. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2025, vol. 28, no. 1, pp. 39–45. DOI: 10.21293/1818-0442-2025-28-1-39-45
Authors and copyright holders:
- Petenenko Ya. A. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
- Trenkal E. I. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
- 1. Brandt A.A. Issledovanie dielectricov na cverhvisokih chastotah [Investigation of dielectrics at ultrahigh frequencies]. Moscow, Physics and Mathematics Publ., 1963, 404 p. (in Russ.).
- 2. Bezhko M. [Changing the parameters of materials in the microwave range using software for analyzing the parameters of materials Keysight N1500A] Technologies in the Electronic Industry, 2015, no. 8, 5 p. (in Russ.).
- 3. Parkhomenko M.P., Kalenov D.S., Eremin I.S., Fedoseev N.A., Kolesnikova V.M., Barinov Y.L. [Waveguide method of measuring electromagnetic parameters of materials in the microwave range and estimation of measurement error] Journal of Radioelectronics, 2018, no. 9, 9 p. (in Russ.).
- 4. Kunrod D. [Determination of the parameters of printed circuit board materials in the millimeter range]. Microwave Electronics, 2019, no. 3, pp. 46–50. (in Russ.).
- 5. Das N.K., Voda S.M., Pozar D.M. Two Methods for the Measurement of Substrate Dielectric Constant. IEEE Transactions on Microwave Theory and Techniques, 1987. Vol. 35, no. 7, pp. 46–50.
- 6. Lederer G.A transmission line method for the measurement of microwave permittivity and permeability: Royal Signals and Radar Establishment. Royal Signals and Radar Establishment, 1990, pp. 217–320.
- 7. Narayanan P.M. Microstrip Transmission Line Method for Broadband Permittivity Measurement of Dielectric Substrates. IEEE Transactions on Microwave Theory and Techniques, 2014, Vol. 62, no. 11, pp. 2784–2790.
- 8.Petenenko Ya.A., Trenkal E.I., Pozdnyakov V.S. [The influence of the instrumental error of the VNA on the accuracy of calculating the dielectric constant by phase methods], Proc. of International Scientific Conference on Electronic Devices and Control Systems, Tomsk, V-Spektr, TUSUIR, 2023, pp. 124–127 (in Russ.).
- 9. Verma A.K., Sadr G.H. Unified dispersion model for multilayer microstrip line. IEEE Transactions on Microwave Theory and Techniques, 1992, Vol. 40, no. 7, pp. 1587–1591.
- 10. Svacina J. [Analysis of multilayer microstrip lines by a conformal mapping method]. IEEE Transactions on Microwave Theory and Techniques, 1992, Vol. 40, no. 4, pp. 769–772.
- 11. Svacina J. [A simple quasi-static determination of basic parameters of multilayer microstrip and coplanar waveguide]. IEEE Transactions on Microwave Theory and Techniques, 1992, Vol. 2, no. 10, pp. 385–387.
- 12. Yunqiu Wu., Zongxi T., Biao Z., Xi H. Electromagnetic parameters measurement for thin film materials. IEEE Transactions on Electromagnetic Compatibility, 2008, pp. 627–629.
- 13. Yoon Y.J., Kim B. A new formula for effective dielectric constant in multi-dielectric layer microstrip structure. IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging, 2000, pp. 163–167.
- 14. Phase-Shift Transmission Line Method for Permittivity Measurement and Its Potential in Sensor Applications / Radonic V., Cselyuszka N., Crnojevic-Bengin V., Kitic G. // Electromagnetic Materials and Devices, 2020. P. 22.
- 15. Chen L.F., Ong C.K., Neo C.P., Varadan V.V., Varadan V.K. Microwave Electronics: Measurement and Materials Characterization. John Wiley & Sons, Ltd, 2004, р. 549.
- 16. Planar Operating Manual overview 804/1. Available at: https://planarchel.ru/upload/medialibrary/8e0/9bzgn33tpawgcl38gd9ddsuipvge4aci/ Part1_8xx_ver22.1.pdf (Accessed: July 01, 2014) (in Russ.).
- 17. Jha K.R., Singh G. [Analysis and design of rectangular microstrip antenna on two-layer substrate materials at terahertz frequency], Journal of Computational Electronics, 2010, vol. 9, pp. 68–78.
- 18. Petenenko Ya.A., Trenkal E.I., Pozdnyakov V.S. [Algorithm for calculating the dielectric permeability of materials by the phase method in conditions of inconsistency]. Proc. of International Scientific Conference for Bachelor, Master, Postgraduate Students and Young Researchers «TUSUR Scientific Session», Tomsk, V-Spektr, TUSUIR, 2024, Part 1, pp. 193–196 (in Russ.).
Last issue
-2026-1_%D0%BA%D0%BE%D0%BF%D0%B8%D1%8F.jpg)
Editorial office address
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 701-582
Executive Secretary of the Editor’s Office
Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia
Phone / Fax: + 7 (3822) 51-21-21 / 51-43-02
Subscription for updates
