Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki / Archive / Issue of Journal № 1, Vol. 26, 2023 / Life-cycle models and security threats to the microchip during its development and exploitation

Life-cycle models and security threats to the microchip during its development and exploitation

DOI: 10.21293/1818-0442-2023-26-1-76-81

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Abstract: The growth of Internet of Things devices has shown the need to advance the information security and more specifically the development and operation of microchips, as modern information systems are built around the latter. This article presents the lifecycle of secure chips used as the Root of Trust of information systems. The main stages of the life cycle of protected chips are described, namely life cycle models during development and operation by the end user.

Keywords: security, secure element, lifecycle, protected microcontrollers

Funding: This article was written within the framework of the Laboratory Research Center "Trusted Sensor Systems" Program (Agreement No. 009/20 dated April 10, 2020) with financial support from the Ministry of Digital Development, Communications and Mass Media of the Russian Federation and JSC "RVC". The subsidy agreement identifier is 0000000007119P190002.

For citation:
Belyakov D. S., Kalinin E. O., Konev A. A., Shelupanov A. A., Mitsel A. A. Life-cycle models and security threats to the microchip during its development and exploitation. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2023, vol. 26, no. 1, pp. 76–81. DOI: 10.21293/1818-0442-2023-26-1-76-81

Authors and copyright holders:

Belyakov D. S. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
Kalinin E. O. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
Konev A. A. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
Shelupanov A. A. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
Mitsel A. A. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)

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