Simulation of resonant strip probes for interference near-field microscopy

Abstract: The analysis of various types of probes used in near-field microwave microscopy devices was carried out. The features of the probes of each type and the area of their application are described. Separately presented are the design features and the results of computer simulation of a probe loaded on a microstrip resonator, which is part of the developed model of the near-field interference microwave microscope.

Keywords: near-field diagnostics, probe, evanescent fields, microwave microscope, resolution

For citation:
Belichenko V. P., Mironchev A. S., Klokov A. V., Zapasnoy A. S. Simulation of resonant strip probes for interference near-field microscopy. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2019, vol. 22, no. 1, pp. 30–34. DOI: 10.21293/1818-0442-2019-22-1-30-34