Methodology for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Vector Network Analyzer

Authors: Zaykov K. D., Anikin A. S., Zaharov F. N., Yarkov K. A., Veber V. I.

Annotation: When designing transceiver paths, the problem of modeling the characteristics of individual components arises. The most universal and convenient for describing the microwave device is the scattering matrix. The use of two-port and four-port vector network analyzers allows to adjust the parameters of most of the developed microwave devices (dividers, filters, amplifiers, etc.). Often, the task is to use a two-port vector network analyzer to measure the parameters of a multi-port device (ports more than 4) to solve the problem of calculating the scattering matrix of the bone connection of adjacent industrial units. The purpose of this article is to compile a methodology for measuring the scattering of multiport devices with a two-port vector network analyzer with a sequence to obtain a measurement of a multi-channel final device (multi-channel radio path). Achieving this goal allows us to provide the necessary basis for the synthesis of domestic software used to develop microwave paths from the point of view of an overview of system analysis.

Keywords: s-parameter measurement technique, s-parameter measurement, scattering matrix, vector network analyzer, microwave device cascading