Abstract: The summary: The development cycles of the device for automatic measurement volt-farad of the characteristics MOS - structures are considered on the basis of the COMPUTER. The problems met by development of the device and variants of their elimination are stated.
For citation:
Troyan P. E., Zaytsev N. G. Automation of measurement of the characteristics of mos-structures with use of trunks ISA and PCI. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2005, no. 3(11), pp. 94–103.
Authors and copyright holders:
- Troyan P. E. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
- Zaytsev N. G.
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