Automation of measurement of the characteristics of mos-structures with use of trunks ISA and PCI

Download article in PDF format

Authors: Troyan P. E., Zaytsev N. G.

Annotation: The summary: The development cycles of the device for automatic measurement volt-farad of the characteristics MOS - structures are considered on the basis of the COMPUTER. The problems met by development of the device and variants of their elimination are stated.

Viktor N. Maslennikov

Executive Secretary of the Editor’s Office

 Editor’s Office: 40 Lenina Prospect, Tomsk, 634050, Russia

  Phone / Fax: + 7 (3822) 51-21-21 / 51-43-02

  vnmas@tusur.ru

Subscription for updates