Methodology for Assessing the Quality of Information Security Event Logging in an Iterative Management Cycle Using the Logging Deficit Metric
DOI: 10.21293/1818-0442-2026-29-1-114-123
DOI: 10.21293/1818-0442-2026-29-1-114-123
Abstract: Relevance. The quality of information security event logging determines the completeness of subsequent normalization, correlation, and incident analysis in SIEM systems. Incomplete or structurally incorrect events reduce infrastructure observability and complicate incident response. Purpose of the study is to develop a methodology for the quantitative assessment of information security event logging quality based on the integral logging deficit indicator DL and the iterative PDCA cycle. Methods. The study uses logging profile formalization, a matrix of event logging requirements, a set of mandatory fields, logging completeness and accuracy metrics, a recurrent DL dynamics model, and an IDEF0 representation of the methodology. Novelty. A methodology is proposed that combines a logging requirements matrix, a set of mandatory fields, the integral DL-indicator, and inter-iteration accounting of newly detected and eliminated deficits in the PDCA cycle. Results. Using a Windows authentication event stream as an example, a decrease in DL from 0.30 to 0.11 over five iterations is shown, with the number of valid records increasing from 700 to 890. Practical significance. The methodology can be applied for formalized logging quality control, prioritizing corrective actions, and integrating event quality assessment into regular information security monitoring processes.
Keywords: PDCA, SIEM, security event logging quality assessment, logging completeness and accuracy, logging deficit, mathematical model, iterative methodologies, ISO 27001, NIST CSF
For citation:
Ivanov A. V., Kiselev M. A. Methodology for Assessing the Quality of Information Security Event Logging in an Iterative Management Cycle Using the Logging Deficit Metric. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2026, vol. 29, no. 1, pp. 114–123. DOI: 10.21293/1818-0442-2026-29-1-114-123
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