Abstract: The paper presents the verification algorithms for vector network analyzers using a special distance-frequency system model. Modeling was conducted for the 110 GHz frequency band at the wafer-level conditions.
Keywords: vector network analyzer, s-parameters, calibration, residual errors, verification, systematic error
For citation:
Savin A. A. Analysis of vector network analyzer verification algorithms for wafer-level application. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2015, no. 1(35), pp. 75–83.
Authors and copyright holders:
- Savin A. A. , Tomsk State University of Control Systems and Radioelectronics (Tomsk, Russia)
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