Abstract: The pulse noise imitator for testing microprocessor units on failure stability was created. Waveforms of generated pulses are shown. The results of testing the microprocessor unit under impact of several noise pulses are presented. Amplitude of transient pulse which causes a failure in running firmware is obtained.
Keywords: noise imitator, nanosecond duration pulse, microsecond duration pulse, microprocessor unit failure
For citation:
Mitrohin V. E., Ryapolov A. V. The pulse noise imitator of nanosecond and microsecond duration. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2012, no. 1(25), – p. 2. pp. 185–188.
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