Abstract: The aspects of the predictive quality inspection for the contemporary microelectronic devices were formulated.
Keywords: informative parameters, marginal voltages, quality inspection
Authors and copyright holders:
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For citation:
Nomokonova N. N., Gavrilov V. Yu., Pivovarov D. S. The Aspects Of The Programmable LSIC Technical Inspection. Doklady Tomskogo gosudarstvennogo universiteta sistem upravleniya i radioelektroniki, 2012, no. 1(25), – p. 1. pp. 15–18.
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