Proceedings of TUSUR University / Archive / Issue of Journal № 1, 1 part [25], 2012 / The Aspects Of The Programmable LSIC Technical Inspection

The Aspects Of The Programmable LSIC Technical Inspection

Authors: Nomokonova N. N., Gavrilov V. Yu., Pivovarov D. S.

Annotation: The aspects of the predictive quality inspection for the contemporary microelectronic devices were formulated.

Keywords: informative parameters, marginal voltages, quality inspection

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